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Timing Measurement Platform for Arbitrary Black-Box Circuits Based on Transition Probability
File(s)
Cheung O02.pdf (1.24 MB)
Accepted version
Author(s)
Wong, Justin SJ
Cheung, Peter YK
Type
Journal Article
Date Issued
2013-12
Citation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2013, 21 (12), pp.2307-2320
URI
DOI
ISSN
1063-8210
Publisher
IEEE
Start Page
2307
End Page
2320
Journal / Book Title
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume
21
Issue
12
Copyright Statement
© 2013 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
License URL
Description
03.06.13 KB. Ok to add the author version to Spiral