MEMS Mass Spectrometers: the Next Wave of Miniaturization
File(s)JMM_MS_R1.pdf (3.99 MB)
Accepted version
Author(s)
Syms, R
Wright, S
Type
Journal Article
Abstract
This paper reviews mass spectrometers based on micro-electro-mechanical systems (MEMS) technology. The MEMS approach to integration is first briefly described, and the difficulties of miniaturizing mass spectrometers are outlined. MEMS components for ionization and mass filtering are then reviewed, together with additional components for ion detection, vacuum pressure measurement and pumping. Mass spectrometer systems containing MEMS sub-components are then described, applications for miniaturized and portable systems are discussed, and challenges and opportunities are presented.
Date Issued
2016-01-08
Date Acceptance
2015-10-20
Citation
Journal of Micromechanics and Microengineering, 2016, 26 (2)
ISSN
1361-6439
Publisher
IOP Publishing
Journal / Book Title
Journal of Micromechanics and Microengineering
Volume
26
Issue
2
Copyright Statement
© 2016 IOP Publishing Ltd.
Subjects
Nanoscience & Nanotechnology
09 Engineering
10 Technology
Publication Status
Published
Article Number
023001