Impact of directional walk on atom probe microanalysis
File(s)
Accepted version
Author(s)
Gault, B
Danoix, F
Hoummada, K
Mangelinck, D
Leitner, H
Type
Journal Article
Abstract
In the atom probe microanalysis of steels, inconsistencies in the measured compositions of solutes (C, N) have often been reported, as well as their appearance as molecular ions. Here we propose that these issues might arise from surface migration of solute atoms over the specimen surface. Surface migration of solutes is evidenced by field-ion microscopy observations, and its consequences on atom probe microanalysis are detailed for a wide range of solute (P, Si, Mn, B, C and N). It is proposed that directional walk driven by field gradients over the specimen surface and thermally activated is the prominent effect.
Date Issued
2012-02-01
Date Acceptance
2011-06-23
Citation
ULTRAMICROSCOPY, 2012, 113, pp.182-191
ISSN
0304-3991
Publisher
ELSEVIER SCIENCE BV
Start Page
182
End Page
191
Journal / Book Title
ULTRAMICROSCOPY
Volume
113
Copyright Statement
© 2011 Elsevier B.V. All rights reserved. This manuscript is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International http://creativecommons.org/licenses/by-nc-nd/4.0/
Identifier
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000300554400014&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
Subjects
Science & Technology
Technology
Microscopy
Atom probe tomography
Surface migration
Artefact
FIELD-ION MICROSCOPE
SURFACE-DIFFUSION
METAL-SURFACES
TUNGSTEN SURFACES
EVAPORATED IONS
POST-IONIZATION
TOMOGRAPHY
DESORPTION
RESOLUTION
CLUSTERS
Publication Status
Published
Date Publish Online
2011-07-12