Variational prototype learning for deep face recognition
Author(s)
Deng, Jiankang
Guo, Jia
Yang, Jing
Lattas, Alexandros
Zafeiriou, Stefanos
Type
Conference Paper
Abstract
Deep face recognition has achieved remarkable improvements due to the introduction of margin-based softmax loss, in which the prototype stored in the last linear layer represents the center of each class. In these methods, training samples are enforced to be close to positive prototypes and far apart from negative prototypes by a clear margin. However, we argue that prototype learning only employs sample-to-prototype comparisons without considering sample-to-sample comparisons during training and the low loss value gives us an illusion of perfect feature embedding, impeding the further exploration of SGD. To this end, we propose Variational Prototype Learning (VPL), which represents every class as a distribution instead of a point in the latent space. By identifying the slow feature drift phenomenon, we directly inject memorized features into prototypes to approximate variational prototype sampling. The proposed VPL can simulate sample-to-sample comparisons within the classification framework, encouraging the SGD solver to be more exploratory, while boosting performance. Moreover, VPL is conceptually simple, easy to implement, computationally efficient and memory saving. We present extensive experimental results on popular benchmarks, which demonstrate the superiority of the proposed VPL method over the state-of-the-art competitors.
Date Issued
2021-11-13
Date Acceptance
2021-11-01
Citation
2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2021, pp.11901-11910
ISSN
1063-6919
Publisher
IEEE COMPUTER SOC
Start Page
11901
End Page
11910
Journal / Book Title
2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
Copyright Statement
© 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works
Identifier
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000742075002010&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
Source
IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
Subjects
Science & Technology
Technology
Computer Science, Artificial Intelligence
Imaging Science & Photographic Technology
Computer Science
Publication Status
Published
Start Date
2021-06-19
Finish Date
2021-06-25
Coverage Spatial
ELECTR NETWORK