An Integrated ISFETs Instrumentation System in Standard CMOS Technology
File(s)05556425.pdf (3.07 MB)
Published version
Author(s)
Chan, WP
Premanode, B
Toumazou, C
Type
Journal Article
Version
Published version
Date Issued
2010-09
Citation
IEEE Journal of Solid-State Circuits, 2010, 45 (9), pp.1923-1934
ISSN
0018-9200
Start Page
1923
End Page
1934
Journal / Book Title
IEEE Journal of Solid-State Circuits
Volume
45
Issue
9
Copyright Statement
© 2010 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Source Volume Number
45