Laser-preparation of geometrically optimised samples for X-ray nano-CT
File(s)
Published version
Author(s)
Type
Journal Article
Abstract
A robust and versatile sample preparation technique for the fabrication of cylindrical pillars for imaging by X-ray nano-computed tomography (nano-CT) is presented. The procedure employs simple, cost-effective laser micro-machining coupled with focused-ion beam (FIB) milling, when required, to yield mechanically robust samples at the micrometre length-scale to match the field-of-view (FOV) for nano-CT imaging. A variety of energy and geological materials are exhibited as case studies, demonstrating the procedure can be applied to a variety of materials to provide geometrically optimised samples whose size and shape are tailored to the attenuation coefficients of the constituent phases. The procedure can be implemented for the bespoke preparation of pillars for both lab- and synchrotron-based X-ray nano-CT investigations of a wide range of samples.
Date Issued
2017-05-15
Date Acceptance
2017-04-16
Citation
Journal of Microscopy, 2017, 267 (3), pp.384-396
ISSN
1365-2818
Publisher
Wiley
Start Page
384
End Page
396
Journal / Book Title
Journal of Microscopy
Volume
267
Issue
3
Copyright Statement
© 2017 The Authors. Journal of Microscopy published by John Wiley & Sons Ltd on behalf of Royal Microscopical Society.
This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.
This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.
License URL
Sponsor
Engineering & Physical Science Research Council (EPSRC)
Grant Number
EP/M014045/1
Subjects
X-ray tomography
laser micro-machining
lithium-ion batteries
sample preparation
shale
solid oxide fuel cells
Publication Status
Published