The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements
File(s)
Published version
Author(s)
Tong, V
Jiang, J
Wilkinson, AJ
Ben Britton, T
Type
Journal Article
Abstract
High resolution, cross-correlation-based, electron backscatter diffraction (EBSD) measures the variation of elastic strains and lattice rotations from a reference state. Regions near grain boundaries are often of interest but overlap of patterns from the two grains could reduce accuracy of the cross-correlation analysis. To explore this concern, patterns from the interior of two grains have been mixed to simulate the interaction volume crossing a grain boundary so that the effect on the accuracy of the cross correlation results can be tested. It was found that the accuracy of HR-EBSD strain measurements performed in a FEG-SEM on zirconium remains good until the incident beam is less than 18 nm from a grain boundary. A simulated microstructure was used to measure how often pattern overlap occurs at any given EBSD step size, and a simple relation was found linking the probability of overlap with step size.
Date Issued
2015-04-28
Date Acceptance
2015-04-26
Citation
Ultramicroscopy, 2015, 155, pp.62-73
ISSN
0304-3991
Publisher
Elsevier
Start Page
62
End Page
73
Journal / Book Title
Ultramicroscopy
Volume
155
Copyright Statement
© 2015 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND
license (http://creativecommons.org/licenses/by-nc-nd/4.0/).
license (http://creativecommons.org/licenses/by-nc-nd/4.0/).
Sponsor
Engineering & Physical Science Research Council (EPSRC)
Grant Number
EP/K034332/1
Subjects
Science & Technology
Technology
Microscopy
Pattern overlap
Cross-correlation
Grain boundary
High-resolution EBSD
DISLOCATION DENSITY DISTRIBUTIONS
ELASTIC STRAIN-MEASUREMENT
MARTENSITIC-TRANSFORMATION
SPATIAL-RESOLUTION
GRAIN-BOUNDARIES
EBSD
ORIENTATION
STRESS
ROTATIONS
PRECISION
0205 Optical Physics
0299 Other Physical Sciences
Publication Status
Published