Local conductance: A means to extract polarization and depolarizing fields near domain walls in ferroelectrics
File(s)Accepted Version APL MS L15-06827R.pdf (742.72 KB)
Accepted version
Author(s)
Douglas, AM
Kumar, A
Whatmore, RW
Gregg, JM
Type
Journal Article
Abstract
Conducting atomic force microscopy images of bulk semiconducting BaTiO3 surfaces show clear
stripe domain contrast. High local conductance correlates with strong out-of-plane polarization
(mapped independently using piezoresponse force microscopy), and current-voltage characteristics
are consistent with dipole-induced alterations in Schottky barriers at the metallic tip-ferroelectric
interface. Indeed, analyzing current-voltage data in terms of established Schottky barrier models
allows relative variations in the surface polarization, and hence the local domain structure, to be
determined. Fitting also reveals the signature of surface-related depolarizing fields concentrated
near domain walls. Domain information obtained from mapping local conductance appears to be
more surface-sensitive than that from piezoresponse force microscopy. In the right materials systems,
local current mapping could therefore represent a useful complementary technique for evaluating
polarization and local electric fields with nanoscale resolution
stripe domain contrast. High local conductance correlates with strong out-of-plane polarization
(mapped independently using piezoresponse force microscopy), and current-voltage characteristics
are consistent with dipole-induced alterations in Schottky barriers at the metallic tip-ferroelectric
interface. Indeed, analyzing current-voltage data in terms of established Schottky barrier models
allows relative variations in the surface polarization, and hence the local domain structure, to be
determined. Fitting also reveals the signature of surface-related depolarizing fields concentrated
near domain walls. Domain information obtained from mapping local conductance appears to be
more surface-sensitive than that from piezoresponse force microscopy. In the right materials systems,
local current mapping could therefore represent a useful complementary technique for evaluating
polarization and local electric fields with nanoscale resolution
Date Issued
2015-10-27
Date Acceptance
2015-10-17
Citation
Applied Physics Letters, 2015, 107 (17)
ISSN
0003-6951
Publisher
AIP Publishing
Journal / Book Title
Applied Physics Letters
Volume
107
Issue
17
Copyright Statement
© 2015 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters 107, 172905 (2015) and may be found at http://dx.doi.org/10.1063/1.4934833
Subjects
Applied Physics
09 Engineering
02 Physical Sciences
Publication Status
Published