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Measurement of the permittivity and loss of high-loss a Near-Field Scanning Microwave Microscope
File(s)
NSMM_final_raw.pdf (1.41 MB)
Accepted version
Author(s)
Gregory, AP
Blackburn, JF
Lees, K
Clarke, RN
Hodgetts, TE
Type
Journal Article
Date Issued
2016-02-01
URI
DOI
ISSN
0304-3991
Publisher
ELSEVIER SCIENCE BV
Start Page
137
End Page
145
Journal / Book Title
ULTRAMICROSCOPY
Volume
161
Copyright Statement
Crown Copyright © 2015 Published by Elsevier B.V. All rights reserved. You may re-use this document/publication (not including logos) free of charge in any format or medium, under the terms of the Open Government Licence v3.0. To view this licence visit: http://www.nationalarchives.gov.uk/doc/open-government-licence
License URL
Identifier
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000367357500018&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
Subjects
Science & Technology
Technology
Microscopy
Dielectric measurement
Microwave microscope
Complex frequency
DIELECTRIC-PROPERTIES
FORCE
0205 Optical Physics
0299 Other Physical Sciences
Publication Status
Published