Simulation-based calibration verification for (sub-)terahertz S-parameter measurements
File(s)
Published version
Author(s)
Shin, Sang-Hee
Lucyszyn, Stepan
Ridler, Nick
Type
Journal Article
Abstract
his article presents a cost-effective method for verifying (sub-)terahertz scattering ( S -)parameter measurements using a vector network analyzer (VNA) with frequency extension modules. The approach reduces the need for physical standards with rigorous dimensional characterization by using full-wave electromagnetic (EM) simulation to create a “simulation-driven reference model” with a predictable uncertainty envelope. This method utilizes the known manufacturing tolerances of generic waveguide sections to generate a pass/fail verification bound. Two simple, calculable waveguide devices (a cross-connected line and reduced-aperture sections) are characterized in the WM-570 (330–500 GHz) band. Excellent agreement is achieved between the EM-simulated predictions and VNA-measured S -parameters, with the measurements falling within the calculated uncertainty bounds. This work demonstrates that combining simple hardware with EM simulation is a reliable and low-cost approach for validating S -parameter measurements and calibrations at terahertz frequencies.
Date Issued
2026-01-01
Date Acceptance
2026-01-18
Citation
IEEE Transactions on Instrumentation and Measurement, 2026, 75, pp.1-5
ISSN
0018-9456
Publisher
Institute of Electrical and Electronics Engineers
Start Page
1
End Page
5
Journal / Book Title
IEEE Transactions on Instrumentation and Measurement
Volume
75
Copyright Statement
© 2026 The Authors. This work is licensed under a Creative Commons Attribution 4.0 License. For more information, see https://creativecommons.org/licenses/by/4.0/
License URL
Publication Status
Published
Article Number
8001405
Date Publish Online
2026-02-08