Two-dimensional discrete dislocation plasticity (DDP) calculations that simulate single crystal films bonded to a rigid substrate under sliding by a rigid sinusoid-shaped asperity are performed with various contact sizes. The contact between the thin film and the asperity is established by a preceding indentation and modelled using a cohesive zone method (CZM), whose behavior is governed by a traction-displacement relation. The emergence of microstructural changes observed in sliding tests has been interpreted as a localized lattice rotation band produced by the activity of dislocations underneath the contact. The depth of the lattice rotation band is predicted to be well commensurate with that observed in the corresponding tests. Furthermore, the dimension and magnitude of the lattice rotation band have been linked to the sliding distance and contact size. This research reveals the underpinning mechanisms for the microstructural changes observed in sliding tests by explicitly modelling the dislocation patterns and highly localized plastic deformation of materials under various indentation and sliding scenarios.