An unfitted finite element method for the numerical approximation of void electromigration
File(s) NurnbergS13preprint.pdf (816.98 KB)
Accepted version
Author(s)
Nürnberg, R
Sacconi, A
Type
Journal Article
Date Issued
2015-01-22
ISSN
0377-0427
Publisher
Elsevier
Start Page
531
End Page
544
Journal / Book Title
Journal of Computational and Applied Mathematics
Volume
270
Copyright Statement
© 2013 Elsevier B.V. All rights reserved. NOTICE: this is the author’s version of a work that was accepted for publication in Journal of Computational and Applied Mathematics. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Journal of Computational and Applied Mathematics, Vol. 270, (2014) DOI 10.1016/j.cam.2013.11.023
Description
22/01/15 meb. Accepted version ok to add.
Identifier
S0377042713006559
