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The isotope exchange depth profiling (IEDP) technique using SIMS and LEIS
File(s)
Author(s)
Kilner, JA
Skinner, SJ
Brongersma, HH
Type
Journal Article
Date Issued
2011-05-01
URI
DOI
ISSN
1432-8488
Publisher
SPRINGER
Start Page
861
End Page
876
Journal / Book Title
JOURNAL OF SOLID STATE ELECTROCHEMISTRY
Volume
15
Issue
5
Copyright Statement
© Springer-Verlag 2011. The final publication is available at link.springer.com
License URL
Description
31.01.14 KB. Ok to add accepted version to spiral, embargo period has expired.
Identifier
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=000290040500002&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202