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  5. Overfiting in linear feature extraction for classificationof high-dimensional image data
 
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Overfiting in linear feature extraction for classificationof high-dimensional image data
File(s)
LiuGillies2015AcceptedAuthorManuscript.pdf (4.13 MB)
Accepted version
Author(s)
Gillies, DF
Liu, R
Type
Journal Article
Abstract
Overfitting has been widely studied in the context of classification and regression. In this paper, we study the overfitting in the context of dimensionality reduction. We show that the conventional wisdom of improving classification performance by maximising inter-class discrimination is not valid for high-dimensional datasets, and can lead to severe overfitting. In particular, we prove the theoretical existence of perfectly discriminative subspace projections, and show that for datasets with very high input dimensionality, inter-class discrimination should be reduced rather than maximised. This naturally leads to a simple dimensionality reduction technique, which we call Soft Discriminant Maps, which we use to show a direct relationship between the classification performance and the level of inter-class discrimination of feature extractors. Moreover, Soft Discriminant Maps consistently exhibit better classification performance than other comparable techniques.
Date Issued
2015-12-02
Date Acceptance
2015-11-16
Citation
Pattern Recognition, 2015, 53, pp.73-86
URI
http://hdl.handle.net/10044/1/33407
DOI
https://www.dx.doi.org/10.1016/j.patcog.2015.11.015
ISSN
1873-5142
Publisher
Elsevier
Start Page
73
End Page
86
Journal / Book Title
Pattern Recognition
Volume
53
Copyright Statement
© 2015 Elsevier. Licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International http://creativecommons.org/licenses/by-nc-nd/4.0/
Subjects
Science & Technology
Technology
Computer Science, Artificial Intelligence
Engineering, Electrical & Electronic
Computer Science
Engineering
Dimensionality reduction
Feature extraction
Classification
High-dimensional datasets
Overfitting
STATISTICAL PATTERN-RECOGNITION
MUTUAL INFORMATION
STEERABLE FILTERS
MODEL SELECTION
CRITERIA
DESIGN
BIAS
Artificial Intelligence & Image Processing
0899 Other Information And Computing Sciences
0906 Electrical And Electronic Engineering
0801 Artificial Intelligence And Image Processing
Publication Status
Published
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