Characterisation of defects in waveguides formed by electron irradiation of silica-on-silicon
File(s)Characterization of defects in waveguides.pdf (121.81 KB)
Published version
Author(s)
Spaargaren,S.M.R.
Syms,R.R.A.
Type
Journal Article
Version
Published version
Date Issued
2000
Citation
IEEE Lightwave Technology, 2000, 4, 18, pp.555-561
ISSN
0733-8724
Start Page
555
End Page
561
Journal / Book Title
IEEE Lightwave Technology
Volume
18
Copyright Statement
© 2000 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
Source Volume Number
18
Edition
4