Inelastic electron tunneling spectroscopy for molecular detection
File(s)
Published version
Author(s)
Zadeh, Yasaman Hamidi
Durrani, Zahid AK
Type
Journal Article
Abstract
Inelastic electron tunneling spectroscopy (IETS) [R. C. Jaklevic and J. Lambe, Phys. Rev. Lett.
17, 1139 (1966); R. G. Keil et al., Appl. Spectrosc. 30, 1 (1976); K. W. Hipps and U. Mazur, J.
Phys. Chem. 97, 7803 (1993); U. Mazur et al., Anal. Chem. 64, 1845 (1992); P. K. Hansma,
Tunneling Spectroscopy (Plenum, New York, 1982)] measurements are performed on Si
nanowire (NW)/SiO2/Al NW tunnel junctions. The tunnel junction area is 50 120 nm and
tunneling occurs across a 10 nm thick SiO2 layer. IETS measurements are performed at 300 K for
ammonium hydroxide (NH4OH), acetic acid (CH3COOH), and propionic acid (C3H6O2)
molecules. The I–V, dI/dV–V, and d2
I/dV2
–V characteristics of the tunnel junction are
measured before and after the adsorption of molecules on the junction using vapor treatment or
immersion. Peaks can be observed in the d2
I/dV2
–V characteristics in all the cases following
molecules adsorption. These peaks may be attributed to vibrational modes of N–H and C–H
bonds.
17, 1139 (1966); R. G. Keil et al., Appl. Spectrosc. 30, 1 (1976); K. W. Hipps and U. Mazur, J.
Phys. Chem. 97, 7803 (1993); U. Mazur et al., Anal. Chem. 64, 1845 (1992); P. K. Hansma,
Tunneling Spectroscopy (Plenum, New York, 1982)] measurements are performed on Si
nanowire (NW)/SiO2/Al NW tunnel junctions. The tunnel junction area is 50 120 nm and
tunneling occurs across a 10 nm thick SiO2 layer. IETS measurements are performed at 300 K for
ammonium hydroxide (NH4OH), acetic acid (CH3COOH), and propionic acid (C3H6O2)
molecules. The I–V, dI/dV–V, and d2
I/dV2
–V characteristics of the tunnel junction are
measured before and after the adsorption of molecules on the junction using vapor treatment or
immersion. Peaks can be observed in the d2
I/dV2
–V characteristics in all the cases following
molecules adsorption. These peaks may be attributed to vibrational modes of N–H and C–H
bonds.
Date Issued
2014-10-02
Date Acceptance
2014-09-23
Citation
Journal of Vacuum Science and Technology B, 2014, 32 (6)
ISSN
2166-2746
Publisher
AIP Publishing
Journal / Book Title
Journal of Vacuum Science and Technology B
Volume
32
Issue
6
Copyright Statement
©2014 American Vacuum Society.
Subjects
Science & Technology
Technology
Physical Sciences
Engineering, Electrical & Electronic
Nanoscience & Nanotechnology
Physics, Applied
Engineering
Science & Technology - Other Topics
Physics
VIBRATION SPECTRA
JUNCTIONS
MICROSCOPY
Publication Status
Published
Article Number
06F601