3D nanostructural characterisation of grain boundaries in atom probe data utilising machine learning methods
Author(s)
Type
Journal Article
Abstract
Boosting is a family of supervised learning algorithm that convert a set of weak learners into a single strong one. It is popular in the field of object tracking, where its main purpose is to extract the position, motion, and trajectory from various features of interest within a sequence of video frames. A scientific application explored in this study is to combine the boosting tracker and the Hough transformation, followed by principal component analysis, to extract the location and trace of grain boundaries within atom probe data. Before the implementation of this method, these information could only be extracted manually, which is time-consuming and error-prone. The effectiveness of this method is demonstrated on an experimental dataset obtained from a pure aluminum bi-crystal and validated on simulated data. The information gained from this method can be combined with crystallographic information directly contained within the data, to fully define the grain boundary character to its 5 degrees of freedom at near-atomic resolution in three dimensions. It also enables local atomic compositional and geometric information, i.e. curvature, to be extracted directly at the interface.
Date Issued
2019-11-18
Date Acceptance
2019-10-27
Citation
PLoS One, 2019, 14 (11), pp.1-19
ISSN
1932-6203
Publisher
Public Library of Science (PLoS)
Start Page
1
End Page
19
Journal / Book Title
PLoS One
Volume
14
Issue
11
Identifier
https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000532826300027&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a2bf6146997ec60c407a63945d4e92bb
Subjects
FIELD EVAPORATION
FOCUSED ION-BEAM
LOCAL MAGNIFICATION
MICROSCOPY
Multidisciplinary Sciences
Science & Technology
Science & Technology - Other Topics
SEGREGATION
SPECIMEN PREPARATION
TOMOGRAPHY
Publication Status
Published
Article Number
ARTN e0225041
Date Publish Online
2019-11-18
