Measuring chromatic aberrations in imaging systems using plasmonic nanoparticles
File(s)
Accepted version
Author(s)
Gennaro, SD
Roschuk, TR
Maier, SA
Oulton, RF
Type
Journal Article
Abstract
We demonstrate a method to measure chromatic aberrations of microscope objectives with metallic nanoparticles using white light. Extinction spectra are recorded while scanning a single nanoparticle through a lens’s focal plane. We show a direct correlation between the focal wavelength and the longitudinal chromatic focal shift through our analysis of the variations between the scanned extinction spectra at each scan position and the peak extinction over the entire scan. The method has been tested on achromat and apochromat objectives using aluminum disks varying in size from 260–520 nm. Our method is straightforward, robust, low cost, and broadband with a sensitivity suitable for assessing longitudinal chromatic aberrations in high-numerical-aperture apochromatic corrected lenses.
Date Issued
2016-04-01
Date Acceptance
2016-03-03
Citation
Optics Letters, 2016, 41 (7), pp.1688-1691
ISSN
1539-4794
Publisher
Optical Society of America
Start Page
1688
End Page
1691
Journal / Book Title
Optics Letters
Volume
41
Issue
7
Copyright Statement
© 2016 Optical Society of America.
Sponsor
The Leverhulme Trust
Commission of the European Communities
Engineering & Physical Science Research Council (EPSRC)
Engineering & Physical Science Research Council (EPSRC)
Engineering & Physical Science Research Council (E
Grant Number
F/07 058/BK
PIRG08-GA-2010-277080
EP/I004343/1
EP/K503381/1
EP/M013812/1
Subjects
Science & Technology
Physical Sciences
Optics
LIGHT
PHASE
physics.optics
0205 Optical Physics
0206 Quantum Physics
0906 Electrical And Electronic Engineering
Publication Status
Published