Ferroelectric behavior in exfoliated 2D aurivillius oxide flakes of sub-unit cell thickness
File(s)Published manuscript_aelm.201901264_R1.pdf (1.24 MB)
Accepted version
Author(s)
Type
Journal Article
Abstract
Ferroelectricity in ultrasonically exfoliated flakes of the layered Aurivillius oxide Bi5Ti3Fe0.5Co0.5O15 with a range of thicknesses is studied. These flakes have relatively large areas (linear dimensions many times the film thickness), thus classifying them as 2D materials. It is shown that ferroelectricity can exist in flakes with thicknesses of only 2.4 nm, which equals one‐half of the normal crystal unit cell. Piezoresponse force microscopy (PFM) demonstrates that these very thin flakes exhibit both piezoelectric effects and that the ferroelectric polarization can be reversibly switched. A new model is presented that permits the accurate modeling of the field‐on and field‐off PFM time domain and hysteresis loop responses from a ferroelectric during switching in the presence of charge injection, storage, and decay through a Schottky barrier at the electrode–oxide interface. The extracted values of spontaneous polarization, 0.04(±0.02) C m−2 and electrostrictive coefficient, 2(±0.1) × 10−2 m4 C−2 are in good agreement with other ferroelectric Aurivillius oxides. Coercive field scales with thickness, closely following the semi‐empirical scaling law expected for ferroelectric materials. This constitutes the first evidence for ferroelectricity in a 2D oxide material, and it offers the prospect of new devices that might use the useful properties associated with the switchable ferroelectric spontaneous polarization in a 2D materials format.
Date Issued
2020-01-30
Date Acceptance
2020-01-01
Citation
Advanced Electronic Materials, 2020, 6 (3), pp.1-12
ISSN
2199-160X
Publisher
Wiley
Start Page
1
End Page
12
Journal / Book Title
Advanced Electronic Materials
Volume
6
Issue
3
Copyright Statement
© 2020 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim. This is the accepted version of the following article: Keeney, L., Smith, R. J., Palizdar, M., Schmidt, M., Bell, A. J., Coleman, J. N., Whatmore, R. W., Ferroelectric Behavior in Exfoliated 2D Aurivillius Oxide Flakes of Sub‐Unit Cell Thickness. Adv. Electron. Mater. 2020, 1901264, which has been published in final form at https://doi.org/10.1002/aelm.201901264
Identifier
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000510124000001&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
Subjects
Science & Technology
Technology
Physical Sciences
Nanoscience & Nanotechnology
Materials Science, Multidisciplinary
Physics, Applied
Science & Technology - Other Topics
Materials Science
Physics
2D materials
ferroelectrics
semiconductors
ultra-thin electronic
BISMUTH TITANATE
PHASE
FIELD
SRBI4TI4O15
DEPENDENCE
FILMS
Publication Status
Published
Article Number
ARTN 1901264
Date Publish Online
2020-01-30