Field dependant hopping conduction across silicon nanocrystal films
Author(s)
Rafiq, MA
Durrani, ZAK
Mizuta, H
Hassan, MM
Oda, S
Type
Journal Article
Abstract
We investigate the electric field dependence of hopping conduction in 300 nm thick films of ˜8 nm
diameter silicon nanocrystals. The hopping conductivity σ follows a lnσ proportional to 1/T^1/2 dependence with temperature T, explained by a percolation hopping conduction model. At high fields F ˜ 10^5 V/cm, the hopping conductivity follows a lnσ proportional to F^1/2 dependence. This dependence is investigated using the concept of “effective temperature,” introduced originally by Shklovskii for hopping conduction in disordered materials.
diameter silicon nanocrystals. The hopping conductivity σ follows a lnσ proportional to 1/T^1/2 dependence with temperature T, explained by a percolation hopping conduction model. At high fields F ˜ 10^5 V/cm, the hopping conductivity follows a lnσ proportional to F^1/2 dependence. This dependence is investigated using the concept of “effective temperature,” introduced originally by Shklovskii for hopping conduction in disordered materials.
Date Issued
2008
Citation
Journal of Applied Physics, 2008, 104, pp.123710-123710-3
ISSN
0021-8979
Publisher
AMER INST PHYSICS
Start Page
123710
End Page
123710-3
Journal / Book Title
Journal of Applied Physics
Volume
104
Issue
12
Copyright Statement
© 2008 American Institute of Physics.
Description
06/05/14 meb. Publisher PDF, OK to add.
Identifier
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=000262225100062&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
ARTN 123710
Publication Status
Published