Direct visualization of chemical transport in solid-state chemical reactions by time-of-flight secondary ion mass spectrometry
File(s)
Author(s)
Pham, Sang T
Tieu, Anh Kiet
Sun, Chao
Wan, Shanhong
Collins, Sean M
Type
Journal Article
Abstract
Systematic control and design of solid-state chemical reactions are required for modifying materials properties and in novel synthesis. Understanding chemical dynamics at the nanoscale is therefore essential to revealing the key reactive pathways. Herein, we combine focused ion beam-scanning electron microscopy (FIB-SEM) and time-of-flight secondary ion mass spectrometry (TOF-SIMS) to track the migration of sodium from a borate coating to the oxide scale during in situ hot corrosion testing. We map the changing distribution of chemical elements and compounds from 50 to 850 °C to reveal how sodium diffusion induces corrosion. The results are validated by in situ X-ray diffraction and post-mortem TOF-SIMS. We additionally retrieve the through-solid sodium diffusion rate by fitting measurements to a Fickian diffusion model. This study presents a step change in analyzing microscopic diffusion mechanics with high chemical sensitivity and selectivity, a widespread analytical challenge that underpins the defining rates and mechanisms of solid-state reactions.
Date Issued
2024-03-27
Date Acceptance
2024-03-05
Citation
Nano Letters: a journal dedicated to nanoscience and nanotechnology, 2024, 24 (12), pp.3702-3709
ISSN
1530-6984
Publisher
American Chemical Society
Start Page
3702
End Page
3709
Journal / Book Title
Nano Letters: a journal dedicated to nanoscience and nanotechnology
Volume
24
Issue
12
Copyright Statement
© 2024 The Authors. Published by American Chemical Society. This publication is licensed under CC-BY 4.0 .
License URL
Identifier
https://www.ncbi.nlm.nih.gov/pubmed/38477517
Subjects
ceramic coatings
hot corrosion
in situ heating
sodium diffusion
TOF-SIMS
Publication Status
Published
Coverage Spatial
United States
Date Publish Online
2024-03-13