Reflections on the projection of ions in atom probe tomography
File(s)1606.08064v2.pdf (8.11 MB)
Accepted version
Author(s)
De Geuser, Frederic
Gault, Baptiste
Type
Journal Article
Abstract
There are two main projections used to transform, and reconstruct, field ion micrographs or atom probe tomography data into atomic coordinates at the specimen surface and, subsequently, in three dimensions. In this article, we present a perspective on the strength of the azimuthal equidistant projection in comparison with the more widely used and well-established point projection (or pseudo-stereographic projection), which underpins data reconstruction in most software packages currently in use across the community. After an overview of the reconstruction methodology, we demonstrate that the azimuthal equidistant is more robust with regards to errors on the parameters used to perform the reconstruction and is therefore more likely to yield more accurate tomographic reconstructions.
Date Issued
2017-04-01
Date Acceptance
2016-12-12
Citation
Microscopy and Microanalysis, 2017, 23 (2), pp.238-246
ISSN
1431-9276
Publisher
Cambridge University Press (CUP)
Start Page
238
End Page
246
Journal / Book Title
Microscopy and Microanalysis
Volume
23
Issue
2
Copyright Statement
© 2017 Cambridge University Press. This paper has been accepted for publication and will appear in a revised form, subsequent to peer-review and/or editorial input by Cambridge University Press.
Identifier
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000405595600006&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
Subjects
Science & Technology
Technology
Materials Science, Multidisciplinary
Microscopy
Materials Science
atom probe tomography
field ion microscopy
tomographic reconstruction
projection
SCANNING-ELECTRON-MICROSCOPE
RECONSTRUCTION
ORIENTATION
MICROGRAPHS
DEPTH
EBSD
Publication Status
Published
Date Publish Online
2017-02-02