The density of trap states (DOS) in organic p-type transistors based on the small-molecule 2,8-difluoro-5,11-bis(triethylsilylethynyl) anthradithiophene (diF-TES ADT), the polymer poly(triarylamine) and blends thereof are investigated. The DOS in these devices are measured as a function of semiconductor composition and operating temperature. We show that increasing operating temperature causes a broadening of the DOS below 250 K. Characteristic trap depths of ∼15 meV are measured at 100 K, increasing to between 20 and 50 meV at room-temperature, dependent on the semiconductor composition. Semiconductor films with high concentrations of diF-TES ADT exhibit both a greater density of trap states as well as broader DOS distributions when measured at room-temperature. These results shed light on the underlying charge transport mechanisms in organic blend semiconductors and the apparent freezing-out of hole conduction through the polymer and mixed polymer/small molecule phases at temperatures below 225 K.