Control of interface defects for efficient and stable quasi-2D Perovskite light-emitting diodes using nickel oxide hole injection layer
File(s)Lee_et_al-2018-Advanced_Science.pdf (2.67 MB)
Published version
Author(s)
Type
Journal Article
Abstract
Metal halide perovskites (MHPs) have emerged as promising materials for light‐emitting diodes owing to their narrow emission spectrum and wide range of color tunability. However, the low exciton binding energy in MHPs leads to a competition between the trap‐mediated nonradiative recombination and the bimolecular radiative recombination. Here, efficient and stable green emissive perovskite light‐emitting diodes (PeLEDs) with an external quantum efficiency of 14.6% are demonstrated through compositional, dimensional, and interfacial modulations of MHPs. The interfacial energetics and optoelectronic properties of the perovskite layer grown on a nickel oxide (NiOx) and poly(3,4‐ethylenedioxythiophene):polystyrene sulfonate hole injection interfaces are investigated. The better interface formed between the NiOx/perovskite layers in terms of lower density of traps/defects, as well as more balanced charge carriers in the perovskite layer leading to high recombination yield of carriers are the main reasons for significantly improved device efficiency, photostability of perovskite, and operational stability of PeLEDs.
Date Issued
2018-11-01
Date Acceptance
2018-09-13
Citation
Advanced Science, 2018, 5 (11)
ISSN
2198-3844
Publisher
Wiley Open Access
Journal / Book Title
Advanced Science
Volume
5
Issue
11
Copyright Statement
© 2018 The Authors. Published by WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim
This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.
This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.
Subjects
defects
nickel oxide
perovskite light‐emitting diodes
stability
Publication Status
Published
Article Number
1801350
Date Publish Online
2018-10-04