Life-history parameters such as pregnancies, skeletal trauma, and renal disease have previously been identified from hypomineralized growth layers (incremental lines) of acellular extrinsic fiber cementum (AEFC). The precise periodicity of these growth layers remains vaguely approximated, so causal life-history explanations using tooth cementum cannot yet be rigorously calculated or tested. On the other hand, we show how life history parameters in AEFC can be identified by two contrasting elemental detection methods. Based on our results we reject the possibility of accurate estimation of pregnancies and other life history parameters from cementum using scanning electron microscopy alone. Here, we propose a new methodological approach for cementum research, Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), to measure degree and distribution of mineralization of cementum growth layers. Our results show that Tof-SIMS can significantly increase our knowledge of cementum composition and is therefore a powerful new tool for life history researchers.